Solar Wafers Counting Based on Image Texture Feature

Qian Zhang, Bo-quan Li, Zhi-quan Sun, Yu-Jun Li, Chang-yun Pan. Solar Wafers Counting Based on Image Texture Feature. In Tieniu Tan, Qiuqi Ruan, Shengjin Wang, Huimin Ma, Kaichang Di, editors, Advances in Image and Graphics Technologies - 10th Chinese Conference, IGTA 2015, Beijing, China, June 19-20, 2015, Proceedings. Volume 525 of Communications in Computer and Information Science, pages 133-141, Springer, 2015. [doi]

@inproceedings{ZhangLSLP15-0,
  title = {Solar Wafers Counting Based on Image Texture Feature},
  author = {Qian Zhang and Bo-quan Li and Zhi-quan Sun and Yu-Jun Li and Chang-yun Pan},
  year = {2015},
  doi = {10.1007/978-3-662-47791-5_16},
  url = {https://doi.org/10.1007/978-3-662-47791-5_16},
  researchr = {https://researchr.org/publication/ZhangLSLP15-0},
  cites = {0},
  citedby = {0},
  pages = {133-141},
  booktitle = {Advances in Image and Graphics Technologies - 10th Chinese Conference, IGTA 2015, Beijing, China, June 19-20, 2015, Proceedings},
  editor = {Tieniu Tan and Qiuqi Ruan and Shengjin Wang and Huimin Ma and Kaichang Di},
  volume = {525},
  series = {Communications in Computer and Information Science},
  publisher = {Springer},
  isbn = {978-3-662-47790-8},
}