A cloud model-based method for the analysis of accelerated life test data

Wenjin Zhang, Shunli Liu, Bo Sun, Yue Liu, Michael G. Pecht. A cloud model-based method for the analysis of accelerated life test data. Microelectronics Reliability, 55(1):123-128, 2015. [doi]

Authors

Wenjin Zhang

This author has not been identified. Look up 'Wenjin Zhang' in Google

Shunli Liu

This author has not been identified. Look up 'Shunli Liu' in Google

Bo Sun

This author has not been identified. Look up 'Bo Sun' in Google

Yue Liu

This author has not been identified. Look up 'Yue Liu' in Google

Michael G. Pecht

This author has not been identified. Look up 'Michael G. Pecht' in Google