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Influential Global and Local Contexts Guided Trace Representation for Fault Localization

Zhuo Zhang 0007, Yan Lei, Ting Su 0001, Meng Yan 0001, Xiaoguang Mao, Yue Yu 0001. Influential Global and Local Contexts Guided Trace Representation for Fault Localization. ACM Transactions on Software Engineering Methodology, 32(3), May 2023. [doi]

Authors

Zhuo Zhang 0007

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Yan Lei

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Ting Su 0001

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Meng Yan 0001

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Xiaoguang Mao

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Yue Yu 0001

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