Chijian Zhang, Junkai Li, Yanxi Zhang, Congcong Liu. Machine Learning and Knowledge Discovery in Analog Circuit Fault Detection. In Maozhen Li, Ning Xiong, Zheng Xiao, Guoqing Xiao, Kenli Li, Libo Wang, editors, 14th International Conference on Natural Computation, Fuzzy Systems and Knowledge Discovery, ICNC-FSKD 2018, Huangshan, China, July 28-30, 2018. pages 276-282, IEEE, 2018. [doi]
@inproceedings{ZhangLZL18-1,
title = {Machine Learning and Knowledge Discovery in Analog Circuit Fault Detection},
author = {Chijian Zhang and Junkai Li and Yanxi Zhang and Congcong Liu},
year = {2018},
doi = {10.1109/FSKD.2018.8686866},
url = {https://doi.org/10.1109/FSKD.2018.8686866},
researchr = {https://researchr.org/publication/ZhangLZL18-1},
cites = {0},
citedby = {0},
pages = {276-282},
booktitle = {14th International Conference on Natural Computation, Fuzzy Systems and Knowledge Discovery, ICNC-FSKD 2018, Huangshan, China, July 28-30, 2018},
editor = {Maozhen Li and Ning Xiong and Zheng Xiao and Guoqing Xiao and Kenli Li and Libo Wang},
publisher = {IEEE},
isbn = {978-1-5386-8097-1},
}