J. W. Zhang, J. Liu, Y. H. Zheng, J. Wang. Student's-t Mixture Model Based Excepted Patch Log Likelihood Method for Image Denoising. In James J. Park, Yi Pan 0001, Gangman Yi, Vincenzo Loia, editors, Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2016, Bangkok, Thailand, 19-21 December. Volume 421 of Lecture Notes in Electrical Engineering, pages 285-290, Springer, 2016. [doi]
@inproceedings{ZhangLZW16-2, title = {Student's-t Mixture Model Based Excepted Patch Log Likelihood Method for Image Denoising}, author = {J. W. Zhang and J. Liu and Y. H. Zheng and J. Wang}, year = {2016}, doi = {10.1007/978-981-10-3023-9_46}, url = {https://doi.org/10.1007/978-981-10-3023-9_46}, researchr = {https://researchr.org/publication/ZhangLZW16-2}, cites = {0}, citedby = {0}, pages = {285-290}, booktitle = {Advances in Computer Science and Ubiquitous Computing - CSA/CUTE 2016, Bangkok, Thailand, 19-21 December}, editor = {James J. Park and Yi Pan 0001 and Gangman Yi and Vincenzo Loia}, volume = {421}, series = {Lecture Notes in Electrical Engineering}, publisher = {Springer}, isbn = {978-981-10-3022-2}, }