Jian Qiu Zhang, Seppo J. Ovaska. ADC characterization based on singular value decomposition. IEEE T. Instrumentation and Measurement, 51(1):138-143, 2002. [doi]
@article{ZhangO02-0,
title = {ADC characterization based on singular value decomposition},
author = {Jian Qiu Zhang and Seppo J. Ovaska},
year = {2002},
doi = {10.1109/19.989917},
url = {http://dx.doi.org/10.1109/19.989917},
tags = {rule-based},
researchr = {https://researchr.org/publication/ZhangO02-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {51},
number = {1},
pages = {138-143},
}