Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection - researchr publication authors

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Siyu Zhang, Lei Su, Jiefei Gu, Ke Li, Weitian Wu, Michael G. Pecht. Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection. Expert Syst. Appl., 238(Part B):121879, March 2024. [doi]

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