A method for fault diagnosis of analog circuit based on rough set

Li Zhang, Lijie Sun, Lichun Wu, Ning Li. A method for fault diagnosis of analog circuit based on rough set. In 3rd International Conference on Awareness Science and Technology, iCAST 2011, Dalian, China, September 27-30, 2011. pages 540-543, IEEE, 2011. [doi]

@inproceedings{ZhangSWL11-0,
  title = {A method for fault diagnosis of analog circuit based on rough set},
  author = {Li Zhang and Lijie Sun and Lichun Wu and Ning Li},
  year = {2011},
  doi = {10.1109/ICAwST.2011.6163188},
  url = {https://doi.org/10.1109/ICAwST.2011.6163188},
  researchr = {https://researchr.org/publication/ZhangSWL11-0},
  cites = {0},
  citedby = {0},
  pages = {540-543},
  booktitle = {3rd International Conference on Awareness Science and Technology, iCAST 2011, Dalian, China, September 27-30, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-0887-9},
}