When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG - researchr publication authors

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Fanchen Zhang, Micah Thornton, Jennifer Dworak. When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 32-39, IEEE, 2014. [doi]

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