Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker. Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. Technometrics, 59(2):202-214, 2017. [doi]
@article{ZhangTEM17,
title = {Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes},
author = {Wei Zhang and Ye Tian and Luis A. Escobar and William Q. Meeker},
year = {2017},
doi = {10.1080/00401706.2016.1172028},
url = {http://dx.doi.org/10.1080/00401706.2016.1172028},
researchr = {https://researchr.org/publication/ZhangTEM17},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {59},
number = {2},
pages = {202-214},
}