Shu Zhang, Yuhong Wang. An improved software defect prediction model based on grey incidence analysis and Naive Bayes algorithm. Journal of Intelligent and Fuzzy Systems, 43(5):6047-6060, 2022. [doi]
@article{ZhangW22b-1,
title = {An improved software defect prediction model based on grey incidence analysis and Naive Bayes algorithm},
author = {Shu Zhang and Yuhong Wang},
year = {2022},
doi = {10.3233/JIFS-213570},
url = {https://doi.org/10.3233/JIFS-213570},
researchr = {https://researchr.org/publication/ZhangW22b-1},
cites = {0},
citedby = {0},
journal = {Journal of Intelligent and Fuzzy Systems},
volume = {43},
number = {5},
pages = {6047-6060},
}