Yue Zhang, Baoguo Wei, Lina Zhao, Jinwei Liu, Zhilang Hao, Lixin Li, Xu Li. Insulator Defect Detection Based on Feature Fusion and Attention Mechanism. In IEEE International Conference on Signal Processing, Communications and Computing, ICSPCC 2022, Xi'an, China, October 25-27, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{ZhangWZLHLL22,
title = {Insulator Defect Detection Based on Feature Fusion and Attention Mechanism},
author = {Yue Zhang and Baoguo Wei and Lina Zhao and Jinwei Liu and Zhilang Hao and Lixin Li and Xu Li},
year = {2022},
doi = {10.1109/ICSPCC55723.2022.9984418},
url = {https://doi.org/10.1109/ICSPCC55723.2022.9984418},
researchr = {https://researchr.org/publication/ZhangWZLHLL22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Conference on Signal Processing, Communications and Computing, ICSPCC 2022, Xi'an, China, October 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6972-2},
}