A variable-level automated defect identification model based on machine learning - researchr publication authors

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Yuwei Zhang, Ying Xing, Yunzhan Gong, Dahai Jin, Honghui Li, Feng Liu. A variable-level automated defect identification model based on machine learning. Soft Comput., 24(2):1045-1061, 2020. [doi]

This author has not been identified. Look up 'Yuwei Zhang' in GoogleThis author has not been identified. Look up 'Ying Xing' in GoogleThis author has not been identified. Look up 'Yunzhan Gong' in GoogleThis author has not been identified. Look up 'Dahai Jin' in GoogleThis author has not been identified. Look up 'Honghui Li' in GoogleThis author has not been identified. Look up 'Feng Liu' in Google

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