Bin Zhang, Jiaxi Ye, Chao Feng, Chaojing Tang. S2F: Discover Hard-to-Reach Vulnerabilities by Semi-Symbolic Fuzz Testing. In 13th International Conference on Computational Intelligence and Security, CIS 2017, Hong Kong, China, December 15-18, 2017. pages 548-552, IEEE, 2017. [doi]
@inproceedings{ZhangYFT17,
title = {S2F: Discover Hard-to-Reach Vulnerabilities by Semi-Symbolic Fuzz Testing},
author = {Bin Zhang and Jiaxi Ye and Chao Feng and Chaojing Tang},
year = {2017},
doi = {10.1109/CIS.2017.00127},
url = {http://doi.ieeecomputersociety.org/10.1109/CIS.2017.00127},
researchr = {https://researchr.org/publication/ZhangYFT17},
cites = {0},
citedby = {0},
pages = {548-552},
booktitle = {13th International Conference on Computational Intelligence and Security, CIS 2017, Hong Kong, China, December 15-18, 2017},
publisher = {IEEE},
isbn = {978-1-5386-4822-3},
}