Yuping Zhang, Liyu You, Chunhua Jia. Fault detection and diagnosis using Bayesian-network inference. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 5049-5053, IEEE, 2017. [doi]
@inproceedings{ZhangYJ17-1,
title = {Fault detection and diagnosis using Bayesian-network inference},
author = {Yuping Zhang and Liyu You and Chunhua Jia},
year = {2017},
doi = {10.1109/IECON.2017.8216872},
url = {https://doi.org/10.1109/IECON.2017.8216872},
researchr = {https://researchr.org/publication/ZhangYJ17-1},
cites = {0},
citedby = {0},
pages = {5049-5053},
booktitle = {IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017},
publisher = {IEEE},
isbn = {978-1-5386-1127-2},
}