Xiaofei Zhang, Yuan Yao, Yaojing Wang, Feng Xu, Jian Lu. Exploring Metadata in Bug Reports for Bug Localization. In Jian Lv, He Jason Zhang, Mike Hinchey, Xiao Liu 0004, editors, 24th Asia-Pacific Software Engineering Conference, APSEC 2017, Nanjing, China, December 4-8, 2017. pages 328-337, IEEE Computer Society, 2017. [doi]
@inproceedings{ZhangYWXL17,
title = {Exploring Metadata in Bug Reports for Bug Localization},
author = {Xiaofei Zhang and Yuan Yao and Yaojing Wang and Feng Xu and Jian Lu},
year = {2017},
doi = {10.1109/APSEC.2017.39},
url = {http://doi.ieeecomputersociety.org/10.1109/APSEC.2017.39},
researchr = {https://researchr.org/publication/ZhangYWXL17},
cites = {0},
citedby = {0},
pages = {328-337},
booktitle = {24th Asia-Pacific Software Engineering Conference, APSEC 2017, Nanjing, China, December 4-8, 2017},
editor = {Jian Lv and He Jason Zhang and Mike Hinchey and Xiao Liu 0004},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3681-7},
}