Cunbo Zhang, Jian-de Zhang, Honggang Wang, Guangxing Du. Burnout properties of microwave pulse injected on GaAs PHEMT. Microelectronics Reliability, 55(3-4):508-513, 2015. [doi]
@article{ZhangZWD15,
title = {Burnout properties of microwave pulse injected on GaAs PHEMT},
author = {Cunbo Zhang and Jian-de Zhang and Honggang Wang and Guangxing Du},
year = {2015},
doi = {10.1016/j.microrel.2015.01.003},
url = {http://dx.doi.org/10.1016/j.microrel.2015.01.003},
researchr = {https://researchr.org/publication/ZhangZWD15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {3-4},
pages = {508-513},
}