Critical line-set configurations to epipolar geometry determination and application to image line transfer

Ming Zhao, Ronald Chung. Critical line-set configurations to epipolar geometry determination and application to image line transfer. Pattern Recognition Letters, 31(8):686-695, 2010. [doi]

@article{ZhaoC10-4,
  title = {Critical line-set configurations to epipolar geometry determination and application to image line transfer},
  author = {Ming Zhao and Ronald Chung},
  year = {2010},
  doi = {10.1016/j.patrec.2009.09.024},
  url = {http://dx.doi.org/10.1016/j.patrec.2009.09.024},
  researchr = {https://researchr.org/publication/ZhaoC10-4},
  cites = {0},
  citedby = {0},
  journal = {Pattern Recognition Letters},
  volume = {31},
  number = {8},
  pages = {686-695},
}