Xueyan Zhao, Yuchen Jiang, Hao Luo, Shen Yin. A Novel Multivariate Statistical Analysis Aided Deep Learning Approach for Nonlinear System Process Monitoring with Comparison Studies. In The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020. pages 2600-2605, IEEE, 2020. [doi]
@inproceedings{ZhaoJLY20,
title = {A Novel Multivariate Statistical Analysis Aided Deep Learning Approach for Nonlinear System Process Monitoring with Comparison Studies},
author = {Xueyan Zhao and Yuchen Jiang and Hao Luo and Shen Yin},
year = {2020},
doi = {10.1109/IECON43393.2020.9255289},
url = {https://doi.org/10.1109/IECON43393.2020.9255289},
researchr = {https://researchr.org/publication/ZhaoJLY20},
cites = {0},
citedby = {0},
pages = {2600-2605},
booktitle = {The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5414-5},
}