On-line reliability assessment for an electronic system subject to condition monitoring

Shuai Zhao, Viliam Makis, Shaowei Chen, Yong Li. On-line reliability assessment for an electronic system subject to condition monitoring. In IEEE International Conference on Prognostics and Health Management, ICPHM 2016, Ottawa, ON, Canada, June 20-22, 2016. pages 1-6, IEEE, 2016. [doi]

Authors

Shuai Zhao

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Viliam Makis

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Shaowei Chen

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Yong Li

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