Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park. Maximal diagnosis of interconnects of random access memories. IEEE Transactions on Reliability, 52(4):423-434, 2003. [doi]
@article{ZhaoMLP03,
title = {Maximal diagnosis of interconnects of random access memories},
author = {Jun Zhao and Fred J. Meyer and Fabrizio Lombardi and Nohpill Park},
year = {2003},
doi = {10.1109/TR.2003.821928},
url = {http://dx.doi.org/10.1109/TR.2003.821928},
researchr = {https://researchr.org/publication/ZhaoMLP03},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {52},
number = {4},
pages = {423-434},
}