Guoyang Zhao, Longzhe Quan, Hailong Li, Huaiqu Feng, Songwei Li, Shuhan Zhang, Ruiqi Liu. Real-time recognition system of soybean seed full-surface defects based on deep learning. Computers and Electronics in Agriculture, 187:106230, 2021. [doi]
@article{ZhaoQLFLZL21, title = {Real-time recognition system of soybean seed full-surface defects based on deep learning}, author = {Guoyang Zhao and Longzhe Quan and Hailong Li and Huaiqu Feng and Songwei Li and Shuhan Zhang and Ruiqi Liu}, year = {2021}, doi = {10.1016/j.compag.2021.106230}, url = {https://doi.org/10.1016/j.compag.2021.106230}, researchr = {https://researchr.org/publication/ZhaoQLFLZL21}, cites = {0}, citedby = {0}, journal = {Computers and Electronics in Agriculture}, volume = {187}, pages = {106230}, }