Guoyang Zhao, Longzhe Quan, Hailong Li, Huaiqu Feng, Songwei Li, Shuhan Zhang, Ruiqi Liu. Real-time recognition system of soybean seed full-surface defects based on deep learning. Computers and Electronics in Agriculture, 187:106230, 2021. [doi]
@article{ZhaoQLFLZL21,
title = {Real-time recognition system of soybean seed full-surface defects based on deep learning},
author = {Guoyang Zhao and Longzhe Quan and Hailong Li and Huaiqu Feng and Songwei Li and Shuhan Zhang and Ruiqi Liu},
year = {2021},
doi = {10.1016/j.compag.2021.106230},
url = {https://doi.org/10.1016/j.compag.2021.106230},
researchr = {https://researchr.org/publication/ZhaoQLFLZL21},
cites = {0},
citedby = {0},
journal = {Computers and Electronics in Agriculture},
volume = {187},
pages = {106230},
}