Improving min-sum LDPC decoding throughput by exploiting intra-cell bit error characteristic in MLC NAND flash memory - researchr publication authors

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Wenzhe Zhao, Hongbin Sun, Minjie Lv, Guiqiang Dong, Nanning Zheng, Tong Zhang 0002. Improving min-sum LDPC decoding throughput by exploiting intra-cell bit error characteristic in MLC NAND flash memory. In IEEE 30th Symposium on Mass Storage Systems and Technologies, MSST 2014, Santa Clara, CA, USA, June 2-6, 2014. pages 1-6, IEEE, 2014. [doi]

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