Xian Zhao, Siqi Wang, Leping Sun. Single and Sequential Sampling Plans for Multi-Attribute Products and Multi-Class Lot in Reliability Test. IEEE Access, 7:81145-81155, 2019. [doi]
@article{ZhaoWS19-0,
title = {Single and Sequential Sampling Plans for Multi-Attribute Products and Multi-Class Lot in Reliability Test},
author = {Xian Zhao and Siqi Wang and Leping Sun},
year = {2019},
doi = {10.1109/ACCESS.2019.2923316},
url = {https://doi.org/10.1109/ACCESS.2019.2923316},
researchr = {https://researchr.org/publication/ZhaoWS19-0},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {81145-81155},
}