Yaoyao Fiona Zhao, Xun Xu, Tom Kramer, Frederick M. Proctor, John Horst. Dimensional metrology interoperability and standardization in manufacturing systems. Computer Standards & Interfaces, 33(6):541-555, 2011. [doi]
@article{ZhaoXKPH11,
title = {Dimensional metrology interoperability and standardization in manufacturing systems},
author = {Yaoyao Fiona Zhao and Xun Xu and Tom Kramer and Frederick M. Proctor and John Horst},
year = {2011},
doi = {10.1016/j.csi.2011.02.009},
url = {http://dx.doi.org/10.1016/j.csi.2011.02.009},
researchr = {https://researchr.org/publication/ZhaoXKPH11},
cites = {0},
citedby = {0},
journal = {Computer Standards & Interfaces},
volume = {33},
number = {6},
pages = {541-555},
}