Wei Zhao, Feng Xie, Yong Peng, Yang Gao, XueFeng Han, Haihui Gao, Dejin Wang. Security Testing Methods and Techniques of Industrial Control Devices. In Kebin Jia, Jeng-Shyang Pan, Yao Zhao, Lakhmi C. Jain, editors, Ninth International Conference on Intelligent Information Hiding and Multimedia Signal Processing, IIH-MSP 2013, Beijing, China, October 16-18, 2013. pages 433-436, IEEE, 2013. [doi]
@inproceedings{ZhaoXPGHGW13,
title = {Security Testing Methods and Techniques of Industrial Control Devices},
author = {Wei Zhao and Feng Xie and Yong Peng and Yang Gao and XueFeng Han and Haihui Gao and Dejin Wang},
year = {2013},
doi = {10.1109/IIH-MSP.2013.114},
url = {http://dx.doi.org/10.1109/IIH-MSP.2013.114},
researchr = {https://researchr.org/publication/ZhaoXPGHGW13},
cites = {0},
citedby = {0},
pages = {433-436},
booktitle = {Ninth International Conference on Intelligent Information Hiding and Multimedia Signal Processing, IIH-MSP 2013, Beijing, China, October 16-18, 2013},
editor = {Kebin Jia and Jeng-Shyang Pan and Yao Zhao and Lakhmi C. Jain},
publisher = {IEEE},
}