A Small-sample Intelligent Fault Diagnosis Method Based on Deep Transfer Learning

Juanru Zhao, Mei Yuan, Jin Cui, Shaopeng Dong, Yufeng Qu, Ben Xu. A Small-sample Intelligent Fault Diagnosis Method Based on Deep Transfer Learning. In 5th International Conference on Data Science and Information Technology, DSIT 2022, Shanghai, China, July 22-24, 2022. pages 1-6, IEEE, 2022. [doi]

@inproceedings{ZhaoYCDQX22,
  title = {A Small-sample Intelligent Fault Diagnosis Method Based on Deep Transfer Learning},
  author = {Juanru Zhao and Mei Yuan and Jin Cui and Shaopeng Dong and Yufeng Qu and Ben Xu},
  year = {2022},
  doi = {10.1109/DSIT55514.2022.9943875},
  url = {https://doi.org/10.1109/DSIT55514.2022.9943875},
  researchr = {https://researchr.org/publication/ZhaoYCDQX22},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {5th International Conference on Data Science and Information Technology, DSIT 2022, Shanghai, China, July 22-24, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9868-5},
}