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Online slack-time binning for IO-registered die-to-die interconnects

Chih-Chieh Zheng, Shi-Yu Huang, Shyue-Kung Lu, Ting-Chi Wang, Kun-Han Tsai, Wu-Tung Cheng. Online slack-time binning for IO-registered die-to-die interconnects. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-8, IEEE, 2016. [doi]

Authors

Chih-Chieh Zheng

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Shi-Yu Huang

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Shyue-Kung Lu

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Ting-Chi Wang

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Kun-Han Tsai

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Wu-Tung Cheng

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