Deep Metric Learning via Adaptive Learnable Assessment

Wenzhao Zheng, Jiwen Lu, Jie Zhou 0001. Deep Metric Learning via Adaptive Learnable Assessment. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 2957-2966, IEEE, 2020. [doi]

Authors

Wenzhao Zheng

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Jiwen Lu

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Jie Zhou 0001

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