Background Line Detection with A Stochastic Model

Yefeng Zheng, Huiping Li, David S. Doermann. Background Line Detection with A Stochastic Model. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2003, Madison, Wisconsin, USA, 16-22 June, 2003. pages 23, IEEE, 2003. [doi]

Authors

Yefeng Zheng

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Huiping Li

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David S. Doermann

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