Wei Zheng, Tianren Shen, Xiang Chen. Just-in-Time Defect Prediction Technology based on Interpretability Technology. In 8th International Conference on Dependable Systems and Their Applications, DSA 2021, Yinchuan, China, August 5-6, 2021. pages 78-89, IEEE, 2021. [doi]
@inproceedings{ZhengSC21-0,
title = {Just-in-Time Defect Prediction Technology based on Interpretability Technology},
author = {Wei Zheng and Tianren Shen and Xiang Chen},
year = {2021},
doi = {10.1109/DSA52907.2021.00017},
url = {https://doi.org/10.1109/DSA52907.2021.00017},
researchr = {https://researchr.org/publication/ZhengSC21-0},
cites = {0},
citedby = {0},
pages = {78-89},
booktitle = {8th International Conference on Dependable Systems and Their Applications, DSA 2021, Yinchuan, China, August 5-6, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4391-3},
}