Yang Zheng, Cong Xu, Yuan Xie 0001. Modeling framework for cross-point resistive memory design emphasizing reliability and variability issues. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 112-117, IEEE, 2015. [doi]
@inproceedings{ZhengX015,
title = {Modeling framework for cross-point resistive memory design emphasizing reliability and variability issues},
author = {Yang Zheng and Cong Xu and Yuan Xie 0001},
year = {2015},
doi = {10.1109/ASPDAC.2015.7058990},
url = {http://dx.doi.org/10.1109/ASPDAC.2015.7058990},
researchr = {https://researchr.org/publication/ZhengX015},
cites = {0},
citedby = {0},
pages = {112-117},
booktitle = {The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7792-5},
}