Increasing Crop Yield Using Agriculture Sensing Data in Smart Plant Factory

Zengwei Zheng, Pengquan Yan, Yuanyi Chen, Jianping Cai, Fengle Zhu. Increasing Crop Yield Using Agriculture Sensing Data in Smart Plant Factory. In Guojun Wang 0001, Bing Chen 0002, Wei Li 0059, Roberto Di Pietro, Xuefeng Yan, Hao Han, editors, Security, Privacy, and Anonymity in Computation, Communication, and Storage - SpaCCS 2020 International Workshops, Nanjing, China, December 18-20, 2020, Proceedings. Volume 12383 of Lecture Notes in Computer Science, pages 345-356, Springer, 2020. [doi]

@inproceedings{ZhengYCCZ20,
  title = {Increasing Crop Yield Using Agriculture Sensing Data in Smart Plant Factory},
  author = {Zengwei Zheng and Pengquan Yan and Yuanyi Chen and Jianping Cai and Fengle Zhu},
  year = {2020},
  doi = {10.1007/978-3-030-68884-4_29},
  url = {https://doi.org/10.1007/978-3-030-68884-4_29},
  researchr = {https://researchr.org/publication/ZhengYCCZ20},
  cites = {0},
  citedby = {0},
  pages = {345-356},
  booktitle = {Security, Privacy, and Anonymity in Computation, Communication, and Storage - SpaCCS 2020 International Workshops, Nanjing, China, December 18-20, 2020, Proceedings},
  editor = {Guojun Wang 0001 and Bing Chen 0002 and Wei Li 0059 and Roberto Di Pietro and Xuefeng Yan and Hao Han},
  volume = {12383},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-030-68884-4},
}