A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions - researchr publication authors

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Zhaohui Zheng, Hong Zheng, Jianping Ju, Deng Chen, Xi Li, Zhongyuan Guo, Changhui You, Mingyu Lin. A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert Syst. Appl., 183:115410, 2021. [doi]

This author has not been identified. Look up 'Zhaohui Zheng' in GoogleThis author has not been identified. Look up 'Hong Zheng' in GoogleThis author has not been identified. Look up 'Jianping Ju' in GoogleThis author has not been identified. Look up 'Deng Chen' in GoogleThis author has not been identified. Look up 'Xi Li' in GoogleThis author has not been identified. Look up 'Zhongyuan Guo' in GoogleThis author has not been identified. Look up 'Changhui You' in GoogleThis author has not been identified. Look up 'Mingyu Lin' in Google

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