Zhiyan Zhong, Yueming Hu. Detection of oxidation region of flexible integrated circuit substrate based on topology mapping. Multimedia Tools Appl., 78(6):7871-7892, 2019. [doi]
@article{ZhongH19,
title = {Detection of oxidation region of flexible integrated circuit substrate based on topology mapping},
author = {Zhiyan Zhong and Yueming Hu},
year = {2019},
doi = {10.1007/s11042-018-6466-7},
url = {https://doi.org/10.1007/s11042-018-6466-7},
researchr = {https://researchr.org/publication/ZhongH19},
cites = {0},
citedby = {0},
journal = {Multimedia Tools Appl.},
volume = {78},
number = {6},
pages = {7871-7892},
}