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A PCB bare board defects detection method based on dual-domain wavelet-YOLO

Xu Zhong, Kun Li. A PCB bare board defects detection method based on dual-domain wavelet-YOLO. In Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering, EITCE 2024, Haikou, Guangdong, China, October 18-20, 2024. pages 1235-1240, ACM, 2024. [doi]

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Xu Zhong

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Kun Li

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