Metric Learning-based Few-Shot Malicious Node Detection for IoT Backhaul/Fronthaul Networks

Ke Zhou, Xi Lin 0003, Jun Wu 0001, Ali Kashif Bashir, Jianhua Li 0001, Muhammad Imran. Metric Learning-based Few-Shot Malicious Node Detection for IoT Backhaul/Fronthaul Networks. In IEEE Global Communications Conference, GLOBECOM 2022, Rio de Janeiro, Brazil, December 4-8, 2022. pages 5777-5782, IEEE, 2022. [doi]

@inproceedings{Zhou00B0I22,
  title = {Metric Learning-based Few-Shot Malicious Node Detection for IoT Backhaul/Fronthaul Networks},
  author = {Ke Zhou and Xi Lin 0003 and Jun Wu 0001 and Ali Kashif Bashir and Jianhua Li 0001 and Muhammad Imran},
  year = {2022},
  doi = {10.1109/GLOBECOM48099.2022.10001659},
  url = {https://doi.org/10.1109/GLOBECOM48099.2022.10001659},
  researchr = {https://researchr.org/publication/Zhou00B0I22},
  cites = {0},
  citedby = {0},
  pages = {5777-5782},
  booktitle = {IEEE Global Communications Conference, GLOBECOM 2022, Rio de Janeiro, Brazil, December 4-8, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-3540-6},
}