A theoretical analysis of lifespan impact on flash memory imposed by erasure code - researchr publication authors

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Enqiang Zhou, Yutong Lu, Nong Xiao, Yang Ou, Zhiguang Chen, Xianqiang Bao. A theoretical analysis of lifespan impact on flash memory imposed by erasure code. In 10th IEEE International Conference on Networking, Architecture and Storage, NAS 2015, Boston, MA, USA, August 6-7, 2015. pages 361-362, IEEE, 2015. [doi]

This author has not been identified. Look up 'Enqiang Zhou' in GoogleThis author has not been identified. Look up 'Yutong Lu' in GoogleThis author has not been identified. Look up 'Nong Xiao' in GoogleThis author has not been identified. Look up 'Yang Ou' in GoogleThis author has not been identified. Look up 'Zhiguang Chen' in GoogleThis author has not been identified. Look up 'Xianqiang Bao' in Google

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