Chaofan Zhou, Meiqin Liu, Senlin Zhang, Ping Wei 0001, Badong Chen. Few-Shot Classification of Screen Defects With Class-Agnostic Mask and Context-Based Classifier. IEEE T. Instrumentation and Measurement, 72:1-16, 2023. [doi]
@article{ZhouLZWC23-0,
title = {Few-Shot Classification of Screen Defects With Class-Agnostic Mask and Context-Based Classifier},
author = {Chaofan Zhou and Meiqin Liu and Senlin Zhang and Ping Wei 0001 and Badong Chen},
year = {2023},
doi = {10.1109/TIM.2023.3280532},
url = {https://doi.org/10.1109/TIM.2023.3280532},
researchr = {https://researchr.org/publication/ZhouLZWC23-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {72},
pages = {1-16},
}