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Improving Testing Coverage for Safety-Critical System by Mutated Specification

Tingliang Zhou, Haiying Sun, Jing Liu, Xiaohong Chen, Dehui Du. Improving Testing Coverage for Safety-Critical System by Mutated Specification. In Sungdeok (Steve) Cha, Yann-Gaël Guéhéneuc, Gihwon Kwon, editors, 21st Asia-Pacific Software Engineering Conference, APSEC 2014, Jeju, South Korea, December 1-4, 2014. Volume 1: Research Papers. pages 43-46, IEEE, 2014. [doi]

Authors

Tingliang Zhou

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Haiying Sun

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Jing Liu

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Xiaohong Chen

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Dehui Du

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