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Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device

Xihong Zhou, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi. Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device. IEICE Trans. Inf. Syst., 107(1):60-71, January 2024. [doi]

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