One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications

Xiaojun Zhu, N. Balakrishnan 0002. One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications. Rel. Eng. & Sys. Safety, 221:108319, 2022. [doi]

Authors

Xiaojun Zhu

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N. Balakrishnan 0002

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