Time Series Data-Driven Batch Assessment of Power System Short-Term Voltage Security

Lipeng Zhu, Chao Lu, Yonghong Luo. Time Series Data-Driven Batch Assessment of Power System Short-Term Voltage Security. IEEE Trans. Industrial Informatics, 16(12):7306-7317, 2020. [doi]

@article{ZhuLL20-3,
  title = {Time Series Data-Driven Batch Assessment of Power System Short-Term Voltage Security},
  author = {Lipeng Zhu and Chao Lu and Yonghong Luo},
  year = {2020},
  doi = {10.1109/TII.2020.2977456},
  url = {https://doi.org/10.1109/TII.2020.2977456},
  researchr = {https://researchr.org/publication/ZhuLL20-3},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {16},
  number = {12},
  pages = {7306-7317},
}