More Powerful and Reliable Second-Level Statistical Randomness Tests for NIST SP 800-22 - researchr publication authors

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Shuangyi Zhu, Yuan Ma, Jingqiang Lin, Jia Zhuang, Jiwu Jing. More Powerful and Reliable Second-Level Statistical Randomness Tests for NIST SP 800-22. In Jung Hee Cheon, Tsuyoshi Takagi, editors, Advances in Cryptology - ASIACRYPT 2016 - 22nd International Conference on the Theory and Application of Cryptology and Information Security, Hanoi, Vietnam, December 4-8, 2016, Proceedings, Part I. Volume 10031 of Lecture Notes in Computer Science, pages 307-329, 2016. [doi]

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