Xiaoming Zhu, Shuo Wang, Junyu Su, Fei Liu, Long Zeng. High-Speed and Accurate Cascade Detection Method for Chip Surface Defects. IEEE T. Instrumentation and Measurement, 73:1-12, 2024. [doi]
@article{ZhuWSLZ24,
title = {High-Speed and Accurate Cascade Detection Method for Chip Surface Defects},
author = {Xiaoming Zhu and Shuo Wang and Junyu Su and Fei Liu and Long Zeng},
year = {2024},
doi = {10.1109/TIM.2024.3351238},
url = {https://doi.org/10.1109/TIM.2024.3351238},
researchr = {https://researchr.org/publication/ZhuWSLZ24},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {73},
pages = {1-12},
}