Qi-Hai Zhu, Rui Zhu, Ning Li, Yu-Bin Yang. Deep metric learning for scene text detection. In 2017 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2017, Banff, AB, Canada, October 5-8, 2017. pages 1025-1029, IEEE, 2017. [doi]
@inproceedings{ZhuZLY17,
title = {Deep metric learning for scene text detection},
author = {Qi-Hai Zhu and Rui Zhu and Ning Li and Yu-Bin Yang},
year = {2017},
doi = {10.1109/SMC.2017.8122745},
url = {https://doi.org/10.1109/SMC.2017.8122745},
researchr = {https://researchr.org/publication/ZhuZLY17},
cites = {0},
citedby = {0},
pages = {1025-1029},
booktitle = {2017 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2017, Banff, AB, Canada, October 5-8, 2017},
publisher = {IEEE},
isbn = {978-1-5386-1645-1},
}