Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard

Neil M. Zimmerman, Mahmoud A. El Sabbagh, Yicheng Wang. Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard. IEEE T. Instrumentation and Measurement, 52(2):608-611, 2003. [doi]

Authors

Neil M. Zimmerman

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Mahmoud A. El Sabbagh

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Yicheng Wang

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