Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis. Impact of different transistor arrangements on gate variability. Microelectronics Reliability, 88:111-115, 2018. [doi]
@article{ZimpeckMAHKR18,
title = {Impact of different transistor arrangements on gate variability},
author = {Alexandra L. Zimpeck and Cristina Meinhardt and Laurent Artola and Guillaume Hubert and Fernanda Lima Kastensmidt and Ricardo Augusto da Luz Reis},
year = {2018},
doi = {10.1016/j.microrel.2018.06.090},
url = {https://doi.org/10.1016/j.microrel.2018.06.090},
researchr = {https://researchr.org/publication/ZimpeckMAHKR18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {111-115},
}