Amir Zjajo, Shaji Krishnan, José Pineda de Gyvez. Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm. In Bernd Straube, Milos Drutarovský, Michel Renovell, Peter Gramata, Mária Fischerová, editors, Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008. pages 287-292, IEEE Computer Society, 2008. [doi]
@inproceedings{ZjajoKG08,
title = {Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm},
author = {Amir Zjajo and Shaji Krishnan and José Pineda de Gyvez},
year = {2008},
doi = {10.1109/DDECS.2008.4538804},
url = {http://dx.doi.org/10.1109/DDECS.2008.4538804},
researchr = {https://researchr.org/publication/ZjajoKG08},
cites = {0},
citedby = {0},
pages = {287-292},
booktitle = {Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008},
editor = {Bernd Straube and Milos Drutarovský and Michel Renovell and Peter Gramata and Mária Fischerová},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-2276-0},
}