Yervant Zorian. Embedded-Quality for Test. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 211-212, IEEE Computer Society, 2000. [doi]
@inproceedings{Zorian00:1,
title = {Embedded-Quality for Test},
author = {Yervant Zorian},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/isqed/2000/0525/00/05250211abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Zorian00%3A1},
cites = {0},
citedby = {0},
pages = {211-212},
booktitle = {1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0525-2},
}